Often power and signals need to enter and exit HEMP protected facilities/shields. Externally generated threat energies can couple onto these lines and may enter the shield through the installed filters. PCI is a test method for measuring performance of a point-of-entry (POE) protective device on a penetrating conductor. A HEMP threat-relatable transient is injected on the penetrating conductor at a point outside the electromagnetic barrier/shield, and the residual internal transient stress is measured inside the barrier/shield.
Gaven Industries has performed pulsed current injection (PCI) testing on thousands of electrical point-of-entry protection devices (PPDs) in accordance with Appendix B of MIL-STD-188-125-1 and -2 (fixed and transportable).
Gaven has designed and manufactured pulse generators capable of outputting MIL-STD-188-125-compliant double-exponential waveforms. These pulse generators output short pulse (E1) current injections up to 5 kA as well as intermediate pulse (E2) current injections up to 250 A. Gaven routinely tests power filters, audio filters, data filters, control/signal filters, as well as RF lines.
Gaven has invested in the development of proprietary software that automates the control of pulse generators, data acquisition, and real-time data analysis. This software streamlines the PCI testing process and provides graphical data moments after injection.
Acceptance PCI (APCI) testing is performed at our facility in Saxonburg, PA immediately after receipt to ensure HEMP Filters (PPDs) meet the residual norm requirements detailed in MIL-STD-188-125. This approach limits schedule risk, as performance issues are identified/rectified at the earliest time possible.
Verification PCI (VPCI) testing is typically performed on-site at the customers’ facility after critical infrastructure/mission-critical equipment (MCE) has been installed. During VPCI testing, PPDs are analyzed to confirm compliance with MIL-STD-188-125. Customers are also provided the opportunity to monitor MCE to ensure mission completion, while simulated HEMP transients are applied to power, control, signal, and RF circuitry.